%0 Conference Paper %1 conf/dac/PomeranzR99 %A Pomeranz, Irith %A Reddy, Sudhakar M. %B DAC %D 1999 %E Irwin, Mary Jane %I ACM Press %K dblp %P 754-759 %T Built-In Test Sequence Generation for Synchronous Sequential Circuits Based on Loading and Expansion of Test Subsequences. %U http://dblp.uni-trier.de/db/conf/dac/dac99.html#PomeranzR99

@inproceedings{conf/dac/PomeranzR99, added-at = {2017-03-16T00:00:00.000+0100}, author = {Pomeranz, Irith and Reddy, Sudhakar M.}, biburl = {https://www.bibsonomy.org/bibtex/2b1b97991493558b668549078f35b7338/dblp}, booktitle = {DAC}, crossref = {conf/dac/1999}, editor = {Irwin, Mary Jane}, ee = {http://doi.acm.org/10.1145/309847.310052}, interhash = {66f470e3fc5aa53ee9606e0c8a3c0712}, intrahash = {b1b97991493558b668549078f35b7338}, keywords = {dblp}, pages = {754-759}, publisher = {ACM Press}, timestamp = {2017-03-17T11:40:28.000+0100}, title = {Built-In Test Sequence Generation for Synchronous Sequential Circuits Based on Loading and Expansion of Test Subsequences.}, url = {http://dblp.uni-trier.de/db/conf/dac/dac99.html#PomeranzR99}, year = 1999 }