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Introduction to deep degradation metric in smart production ecosystems

Y. Adhisantoso, Q. Xuan, C. Kellerman, M. Munderloh, and J. Ostermann. 16th CIRP Conference on Intelligent Computation in Manufacturing Engineering, CIRP ICME , (2022)

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%0 Conference Paper
%1 AdhLeX2022
%A Adhisantoso, Yeremia Gunawan
%A Xuan, Quy Le
%A Kellerman, Christoph
%A Munderloh, Marco
%A Ostermann, Jörn
%B 16th CIRP Conference on Intelligent Computation in Manufacturing Engineering, CIRP ICME
%D 2022
%K Introduction deep leibnizailab myown to
%T Introduction to deep degradation metric in smart production ecosystems

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copydeleteadd this publication to your clipboardcommunity posthistory of this postURLDOIBibTeXEndNoteAPAChicagoDIN 1505HarvardMSOffice XML Introduction to deep degradation metric in smart production ecosystems

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Introduction to deep degradation metric in smart production ecosystems

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