Article,

The Neumann Sieve Problem and Dimensional Reduction: A Multiscale Approach

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Math. Models Methods Appl. Sci., 17 (05): 681--735 (May 1, 2007)
DOI: 10.1142/s0218202507002078

Abstract

We perform a multiscale analysis for the elastic energy of a n-dimensional bilayer thin film of thickness 2δ whose layers are connected through an ε-periodically distributed contact zone. Describing the contact zone as a union of (n - 1)-dimensional balls of radius r ? ε (the holes of the sieve) and assuming that δ ? ε, we show that the asymptotic memory of the sieve (as ε ? 0) is witnessed by the presence of an extra interfacial energy term. Moreover, we find three different limit behaviors (or regimes) depending on the mutual vanishing rate of δ and r. We also give an explicit nonlinear capacitary-type formula for the interfacial energy density in each regime.

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