%0 Conference Paper %1 conf/isocc/YunC22 %A Yun, Dong-Kil %A Chun, Jung-Hoon %B ISOCC %D 2022 %I IEEE %K dblp %P 290-291 %T STT-MRAM Read and Write Circuit for High Reliability and Power Efficiency. %U http://dblp.uni-trier.de/db/conf/isocc/isocc2022.html#YunC22 %@ 978-1-6654-5971-6

@inproceedings{conf/isocc/YunC22, added-at = {2023-02-15T00:00:00.000+0100}, author = {Yun, Dong-Kil and Chun, Jung-Hoon}, biburl = {https://www.bibsonomy.org/bibtex/276c4796f7198e14d89698be763fcdfbf/dblp}, booktitle = {ISOCC}, crossref = {conf/isocc/2022}, ee = {https://doi.org/10.1109/ISOCC56007.2022.10031601}, interhash = {89f9683c1ebfe4f49071256fa5a7552b}, intrahash = {76c4796f7198e14d89698be763fcdfbf}, isbn = {978-1-6654-5971-6}, keywords = {dblp}, pages = {290-291}, publisher = {IEEE}, timestamp = {2024-04-09T23:34:16.000+0200}, title = {STT-MRAM Read and Write Circuit for High Reliability and Power Efficiency.}, url = {http://dblp.uni-trier.de/db/conf/isocc/isocc2022.html#YunC22}, year = 2022 }