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- BibTeX key
- conf/date/TangCRWRP05
- entry type
- inproceedings
- booktitle
- DATE
- year
- 2005
- pages
- 450-455
- publisher
- IEEE Computer Society
- crossref
- conf/date/2005
- ee
- http://dl.acm.org/citation.cfm?id=1049147
- isbn
- 0-7695-2288-2
- url
- http://dblp.uni-trier.de/db/conf/date/date2005.html#TangCRWRP05
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- please select -%0 Conference Paper
%1 conf/date/TangCRWRP05
%A Tang, Huaxing
%A Chen, Gang
%A Reddy, Sudhakar M.
%A Wang, Chen
%A Rajski, Janusz
%A Pomeranz, Irith
%B DATE
%D 2005
%I IEEE Computer Society
%K dblp
%P 450-455
%T Defect Aware Test Patterns.
%U http://dblp.uni-trier.de/db/conf/date/date2005.html#TangCRWRP05
%@ 0-7695-2288-2
@inproceedings{conf/date/TangCRWRP05,
added-at = {2023-03-24T00:00:00.000+0100},
author = {Tang, Huaxing and Chen, Gang and Reddy, Sudhakar M. and Wang, Chen and Rajski, Janusz and Pomeranz, Irith},
biburl = {https://www.bibsonomy.org/bibtex/24a6c6c92f09748ae03b237bdde84f010/dblp},
booktitle = {DATE},
crossref = {conf/date/2005},
ee = {http://dl.acm.org/citation.cfm?id=1049147},
interhash = {9790eaccbd4549a80aaacea4ea79da22},
intrahash = {4a6c6c92f09748ae03b237bdde84f010},
isbn = {0-7695-2288-2},
keywords = {dblp},
pages = {450-455},
publisher = {IEEE Computer Society},
timestamp = {2024-04-10T06:52:06.000+0200},
title = {Defect Aware Test Patterns.},
url = {http://dblp.uni-trier.de/db/conf/date/date2005.html#TangCRWRP05},
year = 2005
}