%0 Conference Paper %1 conf/micro/KimJPMSBG12 %A Kim, Youngtaek %A John, Lizy Kurian %A Pant, Sanjay %A Manne, Srilatha %A Schulte, Michael J. %A Bircher, William Lloyd %A Govindan, Madhu Saravana Sibi %B MICRO %D 2012 %I IEEE Computer Society %K dblp %P 212-223 %T AUDIT: Stress Testing the Automatic Way. %U http://dblp.uni-trier.de/db/conf/micro/micro2012.html#KimJPMSBG12 %@ 978-1-4673-4819-5

@inproceedings{conf/micro/KimJPMSBG12, added-at = {2022-05-31T00:00:00.000+0200}, author = {Kim, Youngtaek and John, Lizy Kurian and Pant, Sanjay and Manne, Srilatha and Schulte, Michael J. and Bircher, William Lloyd and Govindan, Madhu Saravana Sibi}, biburl = {https://www.bibsonomy.org/bibtex/2b37d7a373a26263177957c18b621ed01/dblp}, booktitle = {MICRO}, crossref = {conf/micro/2012}, ee = {http://dl.acm.org/citation.cfm?id=2457500}, interhash = {a10f7ec620808fc8f5989f5848704410}, intrahash = {b37d7a373a26263177957c18b621ed01}, isbn = {978-1-4673-4819-5}, keywords = {dblp}, pages = {212-223}, publisher = {IEEE Computer Society}, timestamp = {2024-04-09T12:46:24.000+0200}, title = {AUDIT: Stress Testing the Automatic Way.}, url = {http://dblp.uni-trier.de/db/conf/micro/micro2012.html#KimJPMSBG12}, year = 2012 }