%0 Conference Paper %1 conf/vlsid/NandiBCCR93 %A Nandi, Sukumar %A Boppana, Vamsi %A Chakraborty, Supratik %A Chaudhuri, Parimal Pal %A Roy, Samir %B VLSI Design %D 1993 %I IEEE Computer Society %K dblp %P 281-286 %T Delay Fault Test Generation with Cellular Automata. %U http://dblp.uni-trier.de/db/conf/vlsid/vlsid1993.html#NandiBCCR93 %@ 0-8186-3180-5

@inproceedings{conf/vlsid/NandiBCCR93, added-at = {2023-03-24T00:00:00.000+0100}, author = {Nandi, Sukumar and Boppana, Vamsi and Chakraborty, Supratik and Chaudhuri, Parimal Pal and Roy, Samir}, biburl = {https://www.bibsonomy.org/bibtex/2acfdfb7ddce50469f9583c0e83e32f7c/dblp}, booktitle = {VLSI Design}, crossref = {conf/vlsid/1993}, ee = {https://doi.ieeecomputersociety.org/10.1109/ICVD.1993.669697}, interhash = {ce63a474f2b155b4bd9b2415cfbe2b77}, intrahash = {acfdfb7ddce50469f9583c0e83e32f7c}, isbn = {0-8186-3180-5}, keywords = {dblp}, pages = {281-286}, publisher = {IEEE Computer Society}, timestamp = {2024-04-10T05:46:57.000+0200}, title = {Delay Fault Test Generation with Cellular Automata.}, url = {http://dblp.uni-trier.de/db/conf/vlsid/vlsid1993.html#NandiBCCR93}, year = 1993 }