%0 Journal Article %1 journals/dt/MalikHMDSE13 %A Malik, Shobhit %A Herrmann, Thomas %A Madhavan, Sriram %A Desineni, Rao %A Schuermyer, Chris %A Eide, Geir %D 2013 %J IEEE Des. Test %K dblp %N 4 %P 26-34 %T Deriving Feature Fail Rate from Silicon Volume Diagnostics Data. %U http://dblp.uni-trier.de/db/journals/dt/dt30.html#MalikHMDSE13 %V 30

@article{journals/dt/MalikHMDSE13, added-at = {2020-03-13T00:00:00.000+0100}, author = {Malik, Shobhit and Herrmann, Thomas and Madhavan, Sriram and Desineni, Rao and Schuermyer, Chris and Eide, Geir}, biburl = {https://www.bibsonomy.org/bibtex/284f6bcd9e65290bf6b560ddfd19258f3/dblp}, ee = {http://doi.ieeecomputersociety.org/10.1109/MDAT.2013.2273791}, interhash = {d1f3d0aca5ba566620fa3606e040ecbe}, intrahash = {84f6bcd9e65290bf6b560ddfd19258f3}, journal = {IEEE Des. Test}, keywords = {dblp}, number = 4, pages = {26-34}, timestamp = {2020-03-14T12:05:59.000+0100}, title = {Deriving Feature Fail Rate from Silicon Volume Diagnostics Data.}, url = {http://dblp.uni-trier.de/db/journals/dt/dt30.html#MalikHMDSE13}, volume = 30, year = 2013 }