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%0 Journal Article
%1 journals/mr/BourgeatGDJMJ11
%A Bourgeat, J.
%A Galy, Philippe
%A Dray, A.
%A Jimenez, Jean
%A Marin-Cudraz, D.
%A Jacquier, Blaise
%D 2011
%J Microelectron. Reliab.
%K dblp
%N 9-11
%P 1614-1617
%T A full characterization of single pitch IO ESD protection based on silicon controlled rectifier and dynamic trigger circuit in CMOS 32 nm node.
%U http://dblp.uni-trier.de/db/journals/mr/mr51.html#BourgeatGDJMJ11
%V 51
@article{journals/mr/BourgeatGDJMJ11,
added-at = {2020-02-22T00:00:00.000+0100},
author = {Bourgeat, J. and Galy, Philippe and Dray, A. and Jimenez, Jean and Marin-Cudraz, D. and Jacquier, Blaise},
biburl = {https://www.bibsonomy.org/bibtex/2797b8d05fa6aba52b252bf66fa3b321c/dblp},
ee = {https://doi.org/10.1016/j.microrel.2011.07.078},
interhash = {d40f498655da0fe984aa7fc3de24e9cf},
intrahash = {797b8d05fa6aba52b252bf66fa3b321c},
journal = {Microelectron. Reliab.},
keywords = {dblp},
number = {9-11},
pages = {1614-1617},
timestamp = {2020-02-25T13:28:39.000+0100},
title = {A full characterization of single pitch IO ESD protection based on silicon controlled rectifier and dynamic trigger circuit in CMOS 32 nm node.},
url = {http://dblp.uni-trier.de/db/journals/mr/mr51.html#BourgeatGDJMJ11},
volume = 51,
year = 2011
}