%0 Journal Article %1 journals/mr/ChenANRNQTLM17 %A Chen, Changqing %A Ang, Ghim Boon %A Ng, Peng Tiong %A Rivai, Francis %A Ng, Hui Peng %A Quah, Alfred C. T. %A Teo, Angela %A Lam, Jeffery %A Mai, Zhihong %D 2017 %J Microelectron. Reliab. %K dblp %P 261-266 %T Embed SRAM IDDOFF fail root cause identification by combination of device analysis and localized circuit analysis. %U http://dblp.uni-trier.de/db/journals/mr/mr76.html#ChenANRNQTLM17 %V 76-77

@article{journals/mr/ChenANRNQTLM17, added-at = {2021-12-21T00:00:00.000+0100}, author = {Chen, Changqing and Ang, Ghim Boon and Ng, Peng Tiong and Rivai, Francis and Ng, Hui Peng and Quah, Alfred C. T. and Teo, Angela and Lam, Jeffery and Mai, Zhihong}, biburl = {https://www.bibsonomy.org/bibtex/23680ac22589b3fa7825f14d88bf75004/dblp}, ee = {https://doi.org/10.1016/j.microrel.2017.07.015}, interhash = {e026c03eb5040992bfddd9a41645ae79}, intrahash = {3680ac22589b3fa7825f14d88bf75004}, journal = {Microelectron. Reliab.}, keywords = {dblp}, pages = {261-266}, timestamp = {2024-04-09T02:49:06.000+0200}, title = {Embed SRAM IDDOFF fail root cause identification by combination of device analysis and localized circuit analysis.}, url = {http://dblp.uni-trier.de/db/journals/mr/mr76.html#ChenANRNQTLM17}, volume = {76-77}, year = 2017 }