%0 Journal Article %1 journals/mr/RandriamihajaHFZPRRB12 %A Randriamihaja, Yoann Mamy %A Huard, Vincent %A Federspiel, Xavier %A Zaka, Alban %A Palestri, Pierpaolo %A Rideau, Denis %A Roy, David %A Bravaix, Alain %D 2012 %J Microelectron. Reliab. %K dblp %N 11 %P 2513-2520 %T Microscopic scale characterization and modeling of transistor degradation under HC stress. %U http://dblp.uni-trier.de/db/journals/mr/mr52.html#RandriamihajaHFZPRRB12 %V 52

@article{journals/mr/RandriamihajaHFZPRRB12, added-at = {2023-09-30T00:00:00.000+0200}, author = {Randriamihaja, Yoann Mamy and Huard, Vincent and Federspiel, Xavier and Zaka, Alban and Palestri, Pierpaolo and Rideau, Denis and Roy, David and Bravaix, Alain}, biburl = {https://www.bibsonomy.org/bibtex/270e3d8bb62d8cf8ff6f99843c0a77a06/dblp}, ee = {https://doi.org/10.1016/j.microrel.2012.04.005}, interhash = {e3bdf9b2eb443f8427f80ad348bdebde}, intrahash = {70e3d8bb62d8cf8ff6f99843c0a77a06}, journal = {Microelectron. Reliab.}, keywords = {dblp}, number = 11, pages = {2513-2520}, timestamp = {2024-04-09T02:50:21.000+0200}, title = {Microscopic scale characterization and modeling of transistor degradation under HC stress.}, url = {http://dblp.uni-trier.de/db/journals/mr/mr52.html#RandriamihajaHFZPRRB12}, volume = 52, year = 2012 }