%0 Journal Article %1 giannazzo:2020:conductive %A Giannazzo, Filippo %A Schilirò, Emanuela %A Greco, Giuseppe %A Roccaforte, Fabrizio %D 2020 %I Multidisciplinary Digital Publishing Institute %J Nanomaterials %K 2D defects review %N 4 %P 803 %T Conductive atomic force microscopy of semiconducting transition metal dichalcogenides and heterostructures %V 10

@article{giannazzo:2020:conductive, added-at = {2021-04-16T14:07:19.000+0200}, author = {Giannazzo, Filippo and Schilir{\`o}, Emanuela and Greco, Giuseppe and Roccaforte, Fabrizio}, biburl = {https://www.bibsonomy.org/bibtex/2e8b7e4341373f7dfd82681226fd02bbb/skoerbel}, interhash = {f571e9ac60867a099d6cca77e1340719}, intrahash = {e8b7e4341373f7dfd82681226fd02bbb}, journal = {Nanomaterials}, keywords = {2D defects review}, number = 4, pages = 803, publisher = {Multidisciplinary Digital Publishing Institute}, timestamp = {2021-04-16T14:07:19.000+0200}, title = {Conductive atomic force microscopy of semiconducting transition metal dichalcogenides and heterostructures}, volume = 10, year = 2020 }