%0 Conference Paper %1 conf/itc/BaikS05 %A Baik, Dong Hyun %A Saluja, Kewal K. %B ITC %D 2005 %I IEEE Computer Society %K dblp %P 10 %T Progressive random access scan: a simultaneous solution to test power, test data volume and test time. %U http://dblp.uni-trier.de/db/conf/itc/itc2005.html#BaikS05 %@ 0-7803-9038-5

@inproceedings{conf/itc/BaikS05, added-at = {2023-03-23T00:00:00.000+0100}, author = {Baik, Dong Hyun and Saluja, Kewal K.}, biburl = {https://www.bibsonomy.org/bibtex/20b936f81d261afefb2a9be5ee974abc8/dblp}, booktitle = {ITC}, crossref = {conf/itc/2005}, ee = {https://doi.ieeecomputersociety.org/10.1109/TEST.2005.1583994}, interhash = {fb37bf265e8e7c64d8519e47883ce4d7}, intrahash = {0b936f81d261afefb2a9be5ee974abc8}, isbn = {0-7803-9038-5}, keywords = {dblp}, pages = 10, publisher = {IEEE Computer Society}, timestamp = {2024-04-10T04:27:57.000+0200}, title = {Progressive random access scan: a simultaneous solution to test power, test data volume and test time.}, url = {http://dblp.uni-trier.de/db/conf/itc/itc2005.html#BaikS05}, year = 2005 }