Author of the publication

Hierarchical Offloading for Delay-Constrained Applications in Fog RAN.

, , , , and . IEEE Trans. Veh. Technol., 69 (4): 4257-4270 (2020)

Please choose a person to relate this publication to

To differ between persons with the same name, the academic degree and the title of an important publication will be displayed. You can also use the button next to the name to display some publications already assigned to the person.

 

Other publications of authors with the same name

Influencing Factors of Intelligent Manufacturing: Empirical Analysis Based on SVR Model., , and . ITQM, volume 122 of Procedia Computer Science, page 1024-1030. Elsevier, (2017)The Tourism-Specific Sentiment Vector Construction Based on Kernel Optimization Function., , , , and . ITQM, volume 122 of Procedia Computer Science, page 1162-1167. Elsevier, (2017)Research on the Correlation of Monthly Electricity Consumption in Different Industries: A Case Study of Bazhou County., , , and . ITQM, volume 139 of Procedia Computer Science, page 496-503. Elsevier, (2018)Joint Optimization of VNF Deployment and Routing in Software Defined Satellite Networks., , , , , , , and . VTC Fall, page 1-5. IEEE, (2018)Automatic blush detection in "Concealed information" test using visual stimuli., , , , and . SoCPaR, page 259-264. IEEE, (2010)Client Scheduling for Unreliable Semi-Decentralized Federated Learning., , , , , , and . ICCT, page 973-978. IEEE, (2023)COVID-19 Impact on Global Electricity Generation Structure-Based on Sustainable Development Perspective., , , and . ITQM, volume 214 of Procedia Computer Science, page 1206-1213. Elsevier, (2022)Time Series Cluster Analysis on Electricity Consumption of North Hebei Province in China., , , , and . ICCS (3), volume 10862 of Lecture Notes in Computer Science, page 765-774. Springer, (2018)Multiwalled carbon nanotube-based hydrogen gas sensors., and . EIT, page 372-376. IEEE, (2008)A Power Efficient Test Data Compression Method for SoC using Alternating Statistical Run-Length Coding., , , and . J. Electron. Test., 32 (1): 59-68 (2016)