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Recent advances in EM and BTI induced reliability modeling, analysis and optimization (invited).

, , , , , and . Integr., (2018)

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GPU-based Ising computing for solving max-cut combinatorial optimization problems., , , , and . Integr., (2019)GPU-based Ising Computing for Solving Balanced Min-Cut Graph Partitioning Problem., , and . CoRR, (2019)Invited - Cross-layer modeling and optimization for electromigration induced reliability., , , , , , and . DAC, page 30:1-30:6. ACM, (2016)Finite difference method for electromigration analysis of multi-branch interconnects., , , and . SMACD, page 1-4. IEEE, (2016)Fast Electromigration Immortality Analysis for Multisegment Copper Interconnect Wires., , , , and . IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 37 (12): 3137-3150 (2018)Dynamic reliability management for near-threshold dark silicon processors., , , , , , and . ICCAD, page 70. ACM, (2016)Accelerating Electromigration Wear-Out Effects Based on Configurable Sink-Structured Wires., , , and . SMACD, page 21-24. IEEE, (2018)Reliability based hardware Trojan design using physics-based electromigration models., , , and . Integr., (2019)Fast Electromigration Stress Evolution Analysis for Interconnect Trees Using Krylov Subspace Method., , , , and . IEEE Trans. Very Large Scale Integr. Syst., 26 (5): 969-980 (2018)Reliability Based Hardware Trojan Design Using Physics-Based Electromigration Models., , , and . SMACD, page 5-8. IEEE, (2018)