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Design of Easily Testable Microprocessors : A Case Study., and . ITC, page 480-483. IEEE Computer Society, (1982)On the Design of Random Pattern Testable PLAs., and . ITC, page 688-695. IEEE Computer Society, (1986)Scan BIST Targeting Transition Faults Using a Markov Source., , and . ISQED, page 497-502. IEEE Computer Society, (2004)At-speed scan test with low switching activity., , , and . VTS, page 177-182. IEEE Computer Society, (2010)On multiple bridging faults., and . VTS, page 221-226. IEEE Computer Society, (2010)EXTEST: a method to extend test sequences of synchronous sequential circuits to increase the fault coverage., and . VTS, page 329-335. IEEE Computer Society, (1997)On Synchronizing Sequences and Test Sequence Partitioning., and . VTS, page 158-167. IEEE Computer Society, (1998)Embedded Tutorial ET2: Volume Diagnosis for Yield Improvement., and . VLSI Design, page 21-23. IEEE Computer Society, (2015)Using Boolean Tests to Improve Detection of Transistor Stuck-Open Faults in CMOS Digital Logic Circuits., , and . VLSI Design, page 399-404. IEEE Computer Society, (2015)On Generating Test Sets that Remain Valid in the Presence of Undetected Faults., and . Great Lakes Symposium on VLSI, page 20-25. IEEE Computer Society, (1997)