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Linear Independence as Evaluation Criterion for Two-Dimensional Test Pattern Generators., , and . VTS, page 377-388. IEEE Computer Society, (2000)A self-driven test structure for pseudorandom testing of non-scan sequential circuits., and . VTS, page 17-25. IEEE Computer Society, (1996)Comparative Study of CA-based PRPGs and LFSRs with Phase Shifters., , and . VTS, page 236-245. IEEE Computer Society, (1999)Design of Phase Shifters for BIST Applications., and . VTS, page 218-224. IEEE Computer Society, (1998)Delay Fault Diagnosis Using Timing Information., , , and . ISQED, page 485-490. IEEE Computer Society, (2004)Multiple Fault Diagnosis Using n-Detection Tests., , , and . ICCD, page 198-. IEEE Computer Society, (2003)On Linear Dependencies in Subspaces of LFSR-Generated Sequences., and . IEEE Trans. Computers, 45 (10): 1212-1216 (1996)STAR-ATPG: a high speed test pattern generator for large scan designs., , , and . ITC, page 1021-1030. IEEE Computer Society, (1999)Cell-aware Production test results from a 32-nm notebook processor., , , , , , , , and . ITC, page 1-9. IEEE Computer Society, (2012)Test response compression and bitmap encoding for embedded memories in manufacturing process monitoring., , , , , and . ITC, page 258-267. IEEE Computer Society, (2001)