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Built-In Self-Test for Systems on Silicon., , and . VLSI Design, page 609-610. IEEE Computer Society, (1999)On Using Implied Values in EDT-based Test Compression., , , , and . DAC, page 11:1-11:6. ACM, (2014)Embedded deterministic test points for compact cell-aware tests., , , , , , , , , and . ITC, page 1-8. IEEE, (2015)Hybrid Ring Generators for In-System Test Applications., , , and . ETS, page 1-6. IEEE, (2023)DIST: Deterministic In-System Test with X-masking., , , and . ITC, page 20-27. IEEE, (2022)On Efficient X-Handling Using a Selective Compaction Scheme to Achieve High Test Response Compaction Ratios., , , , , and . VLSI Design, page 59-64. IEEE Computer Society, (2005)Low power compression of incompatible test cubes., , , , , and . ITC, page 704-713. IEEE Computer Society, (2010)High Throughput Diagnosis via Compression of Failure Data in Embedded Memory BIST., , , and . ITC, page 1-10. IEEE Computer Society, (2008)Two-Dimensional Test Data Decompressor for Multiple Scan Designs., , , and . ITC, page 186-194. IEEE Computer Society, (1996)Linear Independence as Evaluation Criterion for Two-Dimensional Test Pattern Generators., , and . VTS, page 377-388. IEEE Computer Society, (2000)