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A DMA and CACHE-based stress schema for burn-in of automotive microcontroller., , , , , , and . LATS, page 1-6. IEEE, (2017)Adaptive Management Techniques for Optimized Burn-in of Safety-Critical SoC., , , , , , and . J. Electron. Test., 34 (1): 43-52 (2018)An Optimized Test During Burn-In for Automotive SoC., , , , , , , and . IEEE Des. Test, 35 (3): 46-53 (2018)Improving Stress Quality for SoC Using Faster-than-At-Speed Execution of Functional Programs., , , , , and . VLSI-SoC (Selected Papers), volume 508 of IFIP Advances in Information and Communication Technology, page 130-151. Springer, (2016)An Evolutionary Algorithm Approach to Stress Program Generation During Burn-In., , , , , , , , , and 1 other author(s). J. Low Power Electron., 14 (1): 86-98 (2018)Faster-than-at-speed execution of functional programs: An experimental analysis., , , , and . VLSI-SoC, page 1-6. IEEE, (2016)A comprehensive methodology for stress procedures evaluation and comparison for Burn-In of automotive SoC., , , , , , , , , and 2 other author(s). DATE, page 646-649. IEEE, (2017)