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Transistor stuck-on fault detection tests for digital CMOS circuits.

X. Lin, S. Reddy, and J. Rajski. ETS, page 1-6. IEEE, (2016)

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Lin Lin

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Low-Power Scan Operation in Test Compression Environment.D. Czysz, M. Kassab, X. Lin, G. Mrugalski, J. Rajski, and J. Tyszer. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 28 (11): 1742-1755 (2009)Using dynamic shift to reduce test data volume in high-compression designs.X. Lin, M. Kassab, and J. Rajski. ETS, page 1-6. IEEE, (2014)On Improving Transition Test Set Quality to Detect CMOS Transistor Stuck-Open Faults.X. Lin, W. Cheng, and J. Rajski. ATS, page 97-102. IEEE Computer Society, (2015)Detecting and diagnosing open defects.D. Tran, L. Winemberg, D. Carder, X. Lin, J. LeBritton, and B. Swanson. ITC, page 811. IEEE Computer Society, (2010)The Impacts of Untestable Defects on Transition Fault Testing.X. Lin, and J. Rajski. VTS, page 2-7. IEEE Computer Society, (2006)Novel Techniques for Achieving High At-Speed Transition Fault Test Coverage for Motorola's Microprocessors Based on PowerPC(tm) Instruction Set Architecture.N. Tendolkar, R. Raina, R. Woltenberg, X. Lin, B. Swanson, and G. Aldrich. VTS, page 3-8. IEEE Computer Society, (2002)Using Boolean Tests to Improve Detection of Transistor Stuck-Open Faults in CMOS Digital Logic Circuits.X. Lin, S. Reddy, and J. Rajski. VLSID, page 399-404. IEEE Computer Society, (2015)On Reducing Scan Shift Activity at RTL.E. Alpaslan, Y. Huang, X. Lin, W. Cheng, and J. Dworak. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 29 (7): 1110-1120 (2010)Thermal-Aware Small-Delay Defect Testing in Integrated Circuits for Mitigating Overkill.D. Xiang, K. Shen, B. Bhattacharya, X. Wen, and X. Lin. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 35 (3): 499-512 (2016)Single Test Type to Replace Broadside and Skewed-Load Tests for Transition Faults.I. Pomeranz, and X. Lin. IEEE Trans. Very Large Scale Integr. Syst., 29 (2): 423-433 (2021)

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Disambiguation of "Lin, Xijiang"

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Transistor stuck-on fault detection tests for digital CMOS circuits.

Please choose a person to relate this publication to

Lin Lin

Lin Lin

Lin Lin

Lin Lin

Lin Lin

Other publications of authors with the same name

Disambiguation

BibSonomy

Disambiguation of "Lin, Xijiang"

copydeleteadd this publication to your clipboardcommunity posthistory of this postURLDOIBibTeXEndNoteAPAChicagoDIN 1505HarvardMSOffice XML Transistor stuck-on fault detection tests for digital CMOS circuits.

Please choose a person to relate this publication to

Lin Lin

Lin Lin

Lin Lin

Lin Lin

Lin Lin

Other publications of authors with the same name

Disambiguation

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Transistor stuck-on fault detection tests for digital CMOS circuits.