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March PS(23N) Test for DRAM Pattern-Sensitive Faults.

, , and . Asian Test Symposium, page 354-. IEEE Computer Society, (1998)

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Universal Address Sequence Generator for Memory Built-in Self-test., , and . CoRR, (2022)Obfuscation as Intellectual Rights Protection in VHDL Language., and . CISIM, page 337-340. IEEE Computer Society, (2007)Symmetric Transparent BIST for RAMs., , and . DATE, page 702-707. IEEE Computer Society / ACM, (1999)Self-Adjusting Output Data Compression: An Efficient BIST Technique for RAMs., , and . DATE, page 173-179. IEEE Computer Society, (1998)Optimal Controlled Random Tests., and . CISIM, volume 10244 of Lecture Notes in Computer Science, page 27-38. Springer, (2017)Antirandom Test Vectors for BIST in Hardware/Software Systems., and . Fundam. Informaticae, 119 (2): 163-185 (2012)Multi Background Memory Testing., , and . CISIM, page 155-156. IEEE Computer Society, (2008)Transparent Memory Testing for Pattern-Sensitive Faults., and . ITC, page 860-869. IEEE Computer Society, (1994)Exact Aliasing Computation for RAM BIST., , and . ITC, page 13-22. IEEE Computer Society, (1995)Zero aliasing ROM BIST., , and . J. Electron. Test., 5 (4): 377-388 (1994)