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Disambiguation of "Appello, Davide"

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Cumulative embedded memory failure bitmap display & analysis.

, , , , , , , and . DDECS, page 255-260. IEEE Computer Society, (2010)

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Davide Cadamuro

Davide Pennino

Davide Pagani

Davide Batic

Davide Cantoni

 

Other publications of authors with the same name

A novel Pattern Selection Algorithm to reduce the Test Cost of large Automotive Systems-on-Chip., , , , , , and . LATS, page 1-6. IEEE, (2022)In-field Data Collection System through Logic BIST for large Automotive Systems-on-Chip., , , , , and . ITC, page 646-649. IEEE, (2022)Exploiting Programmable BIST For The Diagnosis of Embedded Memory Cores., , , , , , and . ITC, page 379-385. IEEE Computer Society, (2003)Effective Screening of Automotive SoCs by Combining Burn-In and System Level Test., , , , , , , , , and . DDECS, page 1-6. IEEE, (2019)A P1500 Compliant BIST-Based Approach to Embedded RAM Diagnosis., , , , and . Asian Test Symposium, page 97-102. IEEE Computer Society, (2001)Optimized embedded memory diagnosis., , , , , , , , and . DDECS, page 347-352. IEEE Computer Society, (2011)Adapting to adaptive testing., , , , , , , , and . DATE, page 556-561. IEEE Computer Society, (2010)Adaptive Management Techniques for Optimized Burn-in of Safety-Critical SoC., , , , , , and . J. Electron. Test., 34 (1): 43-52 (2018)A Toolchain to Quantify Burn-In Stress Effectiveness on Large Automotive System-on-Chips., , , , , , , and . IEEE Access, (2023)A Low-Cost Burn-In Tester Architecture to Supply Effective Electrical Stress., , , , , , , , , and 1 other author(s). IEEE Trans. Computers, 72 (5): 1447-1459 (May 2023)