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Dione: an integrated measurement and defect prediction solution

, , , , , and . 20th ACM SIGSOFT Symposium on the Foundations of Software Engineering (FSE-20), SIGSOFT/FSE'12, Cary, NC, USA - November 11 - 16, 2012, page 20. (2012)
DOI: 10.1145/2393596.2393619

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