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A Formal Perspective on Effective Post-silicon Debug and Trace Signal Selection.

, , , , and . VDAT, volume 711 of Communications in Computer and Information Science, page 753-766. Springer, (2017)

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A Novel Approach for On-chip Step Down DC-to-DC Converter with DC Voltage Control.. Asia International Conference on Modelling and Simulation, page 311-313. IEEE, (2013)A technique for low power, stuck-at fault diagnosable and reconfigurable scan architecture., , , , and . EWDTS, page 1-4. IEEE Computer Society, (2016)Skip-scan: A methodology for test time reduction., , , and . VDAT, page 1-6. IEEE, (2016)A Formal Perspective on Effective Post-silicon Debug and Trace Signal Selection., , , , and . VDAT, volume 711 of Communications in Computer and Information Science, page 753-766. Springer, (2017)Revisiting random access scan for effective enhancement of post-silicon observability., , , , and . IOLTS, page 132-137. IEEE, (2017)Modeling, Simulation of Multi Standard Wireless Receivers in MATLAB/SIMULINK.. Asia International Conference on Modelling and Simulation, page 128-131. IEEE, (2013)Precision Low Voltage and Current References., and . J. Low Power Electron., 3 (2): 167-174 (2007)