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Disambiguation of "Nolhier, Nicolas"

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Accelerated lifetime test of RF-MEMS switches under ESD stress.

, , , , , , , , and . Microelectron. Reliab., 49 (9-11): 1256-1259 (2009)

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Nicolas Jeanvoine

Plasma-material interaction and electrode degradation in high voltage ignition discharges. Uni Saarbrücken, (2009)

Nicolas Streidl

Nicolas Grett

Nicolas Simon

Nicolas Spethmann

 

Other publications of authors with the same name

An Accelerated Stress Test Method for Electrostatically Driven MEMS Devices., , , , , , and . IEEE Trans. Instrumentation and Measurement, 61 (2): 456-461 (2012)Prediction of LIN communication robustness against EFT events using dedicated failure models., , , and . Microelectron. Reliab., (2017)Building-up of system level ESD modeling: Impact of a decoupling capacitance on ESD propagation., , , , and . Microelectron. Reliab., 53 (2): 221-228 (2013)Electrostatic discharge failure analysis of capacitive RF MEMS switches., , , , , , and . Microelectron. Reliab., 47 (9-11): 1818-1822 (2007)Analysis and Compact Modeling of a Vertical Grounded-Base n-p-n Bipolar Transistor Used as ESD Protection in a Smart Power Technology, , , , , , , , and . IEEE J.~Solid~State~Circuits, 36 (9): 1373--1381 (September 2001)Editorial., , , , and . Microelectron. Reliab., 55 (9-10): 1269-1270 (2015)Different Failure signatures of multiple TLP and HBM Stresses in an ESD robust protection structure., , , , , , , , and . Microelectron. Reliab., 45 (9-11): 1415-1420 (2005)Analysis and compact modeling of a vertical grounded-base n-p-n bipolar transistor used as ESD protection in a smart power technology., , , , , , , , and . IEEE J. Solid State Circuits, 36 (9): 1373-1381 (2001)Determination of the ESD Failure Cause Through its Signature., , , , , and . Microelectron. Reliab., 43 (9-11): 1551-1556 (2003)Low Frequency Noise Measurements for ESD Latent Defect Detection in High Reliability Applications., , , , , , , , and . Microelectron. Reliab., 44 (9-11): 1781-1786 (2004)