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ASTEP (2005-2015): Ten years of soft error and atmospheric radiation characterization on the Plateau de Bure., , , , , , and . Microelectron. Reliab., 55 (9-10): 1506-1511 (2015)Multi-Poisson process analysis of real-time soft-error rate measurements in bulk 65 nm and 40 nm SRAMs., , , , and . Microelectron. Reliab., (2017)Soft-errors induced by terrestrial neutrons and natural alpha-particle emitters in advanced memory circuits at ground level., , , , , , , , , and 3 other author(s). Microelectron. Reliab., 50 (9-11): 1822-1831 (2010)Radiation sensitivity of junctionless double-gate 6T SRAM cells investigated by 3-D numerical simulation., and . Microelectron. Reliab., 54 (9-10): 2284-2288 (2014)SEU sensitivity of Junctionless Single-Gate SOI MOSFETs-based 6T SRAM cells investigated by 3D TCAD simulation., and . Microelectron. Reliab., 55 (9-10): 1501-1505 (2015)Natural radiation events in CCD imagers at ground level., , , and . Microelectron. Reliab., (2016)Soft-Error Rate of Advanced SRAM Memories: Modeling and Monte Carlo Simulation, , , , , and . Numerical Simulation -- From Theory to Industry, chapter 15, InTech, (September 2012)Single-event-transient effects in Junctionless Double-Gate MOSFETs with Dual-Material Gate investigated by 3D simulation., , and . Microelectron. Reliab., (2017)Particle Monte Carlo modeling of single-event transient current and charge collection in integrated circuits., , , , , and . Microelectron. Reliab., 54 (9-10): 2278-2283 (2014)3D simulation of single-event-transient effects in symmetrical dual-material double-gate MOSFETs., and . Microelectron. Reliab., 55 (9-10): 1522-1526 (2015)