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On Using Implied Values in EDT-based Test Compression., , , , and . DAC, page 11:1-11:6. ACM, (2014)Cube-Contained Random Patterns and Their Applications to the Complete Testing of Synthesized Multi-Level Circuits., and . ITC, page 473-482. IEEE Computer Society, (1991)On Linear Dependencies in Subspaces of LFSR-Generated Sequences., and . IEEE Trans. Computers, 45 (10): 1212-1216 (1996)High Performance Dense Ring Generators., , , and . IEEE Trans. Computers, 55 (1): 83-87 (2006)Embedded deterministic test points for compact cell-aware tests., , , , , , , , , and . ITC, page 1-8. IEEE, (2015)Self-test methodology for at-speed test of crosstalk in chip interconnects., , and . DAC, page 619-624. ACM, (2000)GEMINI-a logic system for fault diagnosis based on set functions.. FTCS, page 292-297. IEEE Computer Society, (1988)Built-In Self-Test for Systems on Silicon., , and . VLSI Design, page 609-610. IEEE Computer Society, (1999)Embedded Deterministic Test for Low-Cost Manufacturing., , , , , and . IEEE Des. Test Comput., 20 (5): 58-66 (2003)2D Test Sequence Generators., , and . IEEE Des. Test Comput., 20 (1): 51-59 (2003)