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A UML-based Approach for Validating Product Lines

, , and . Proceedings of the International Workshop on Software Product Line Testing (SPLiT 2004), page 58--65. Boston, MA, (August 2004)

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Dealing with Test Automation Debt at Microsoft.. COMPSAC Workshops, page 136. IEEE Computer Society, (2011)A UML-based Approach for Validating Product Lines, , and . Proceedings of the International Workshop on Software Product Line Testing (SPLiT 2004), page 58--65. Boston, MA, (August 2004)A UML-based approach to system testing., , , and . Innov. Syst. Softw. Eng., 1 (1): 12-24 (2005)Low power consumption and high-speed Ge receivers., , , , , , , , , and 3 other author(s). OFC, page 1-3. IEEE, (2017)Ultra-fast silicon-based optoelectronic devices on a 300 mm CMOS platform for on-chip optical interconnects., , , , , , , , , and 2 other author(s). ICTON, page 1. IEEE, (2015)A Source of Heralded Single Photon Using High Quality Factor Silicon Ring Resonators., , , , , , , , , and 2 other author(s). ICTON, page 1-4. IEEE, (2019)Experimental Demonstration of mid-IR Octave Spanning Supercontinuum Generation in Low Loss Silicon-Germanium Waveguide., , , , , , , , , and 1 other author(s). OFC, page 1-2. IEEE, (2018)3D monolithic integration., , , , , , , , , and 6 other author(s). ISCAS, page 2233-2236. IEEE, (2011)GeSn Vertical Gate-all-around Nanowire n-type MOSFETs., , , , , , , , and . ESSDERC, page 364-367. IEEE, (2022)40Gbit/s germanium waveguide photodiode., , , , , , , , and . OFC/NFOEC, page 1-3. IEEE, (2013)