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Test vector chains for increased targeted and untargeted fault coverage., and . ASP-DAC, page 663-666. IEEE, (2008)Resynthesis for Avoiding Undetectable Faults Based on Design-for-Manufacturability Guidelines., , , , and . DATE, page 1022-1027. IEEE, (2019)Selection of a fault model for fault diagnosis based on unique responses., and . DATE, page 994-999. IEEE, (2009)A supervised machine learning application in volume diagnosis., , , , , , and . ETS, page 1-6. IEEE, (2019)Volume diagnosis data mining., , and . ETS, page 1-10. IEEE, (2017)Input test data volume reduction based on test vector chains., and . European Test Symposium, page 240. IEEE Computer Society, (2010)Test Generation for Synchronous Sequential Circuits Using Multiple Observation Times., and . FTCS, page 52-59. IEEE Computer Society, (1991)EXOP (Extended Operation): A New Logical Fault Model for Digital Circuits., and . FTCS, page 166-175. IEEE Computer Society, (1993)Synthesis of Multi-Level Combinational Circuits for Complete Robust Path Delay Fault Testability., , , and . FTCS, page 280-287. IEEE Computer Society, (1992)On the design of robust testable CMOS combinational logic circuits., and . FTCS, page 220-225. IEEE Computer Society, (1988)