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Defect-Oriented Test: Effectiveness in High Volume Manufacturing., , , , , , , , and . IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 40 (3): 584-597 (2021)Embedded multi-detect ATPG and Its Effect on the Detection of Unmodeled Defects., , , , and . ITC, page 1-10. IEEE Computer Society, (2007)Cell-aware experiences in a high-quality automotive test suite., , , , , , , , , and 5 other author(s). ETS, page 1-6. IEEE, (2014)Bridge over troubled waters: Critical area based pattern generation., , , and . ETS, page 1-6. IEEE, (2017)DPPM Reduction Methods and New Defect Oriented Test Methods Applied to Advanced FinFET Technologies., , , , , , , , , and . ITC, page 1-10. IEEE, (2018)Efficient Pattern Mapping for Deterministic Logic BIST., , , , , and . ITC, page 48-56. IEEE Computer Society, (2004)ATPG Padding And ATE Vector Repeat Per Port For Reducing Test Data Volume., , , , and . ITC, page 1069-1078. IEEE Computer Society, (2003)Fault collapsing of multi-conditional faults., , and . DDECS, page 42-47. IEEE Computer Society, (2013)Total Critical Area Based Testing., and . ITC, page 1-10. IEEE, (2018)Introduction to the defect-oriented cell-aware test methodology for significant reduction of DPPM rates., and . European Test Symposium, page 1-6. IEEE Computer Society, (2012)