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Precomputation-based Guarding for Dynamic and Leakage Power Reduction.

, , , and . ICCD, page 90-97. IEEE Computer Society, (2003)

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VLSI Implementation of An Efficient ASIC Architecture for Real-Time Rotation of Digital Images., and . IJPRAI, 9 (2): 449-462 (1995)KLOVER: Automatic Test Generation for C and C Programs, Using Symbolic Execution., , , , , , , and . IEEE Softw., 34 (5): 30-37 (2017)A BIST scheme for RTL circuits based on symbolic testabilityanalysis., , and . IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 19 (1): 111-128 (2000)A low overhead design for testability and test generation technique for core-based systems-on-a-chip., , and . IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 18 (11): 1661-1676 (1999)SymJS: automatic symbolic testing of JavaScript web applications., , and . SIGSOFT FSE, page 449-459. ACM, (2014)Ising-Based Louvain Method: Clustering Large Graphs with Specialized Hardware., , , and . IDA, volume 12695 of Lecture Notes in Computer Science, page 350-361. Springer, (2021)High Level Test Generation for Custom Hardware: An Industrial Perspective.. Asian Test Symposium, page 458. IEEE Computer Society, (2005)Automatic test pattern generation for functional RTL circuits using assignment decision diagrams., and . DAC, page 43-48. ACM, (2000)A Fast and Low Cost Testing Technique for Core-Based System-on-Chip., , and . DAC, page 542-547. ACM Press, (1998)PASS: String Solving with Parameterized Array and Interval Automaton., and . Haifa Verification Conference, volume 8244 of Lecture Notes in Computer Science, page 15-31. Springer, (2013)