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On Efficient X-Handling Using a Selective Compaction Scheme to Achieve High Test Response Compaction Ratios.

, , , , , and . VLSI Design, page 59-64. IEEE Computer Society, (2005)

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On Methods to Improve Location Based Logic Diagnosis., , , and . VLSI Design, page 181-187. IEEE Computer Society, (2006)Employing the STDF V4-2007 Standard for Scan Test Data Logging., , , , , and . IEEE Des. Test, 29 (6): 91-99 (2012)A case study for using dynamic partitioning based solution in volume diagnosis., , , , , and . DATE, page 1001-1002. IEEE, (2018)Scan Chain Diagnosis Based on Unsupervised Machine Learning., , , , , and . ATS, page 225-230. IEEE Computer Society, (2017)Hyperactive Faults Dictionary to Increase Diagnosis Throughput., , , , , and . ATS, page 173-178. IEEE Computer Society, (2008)Diagnosis of Multiple Faults Based on Fault-Tuple Equivalence Tree., , , , and . DFT, page 217-225. IEEE Computer Society, (2011)On Testing of Interconnect Open Defects in Combinational Logic Circuits with Stems of Large Fanout., , , , and . ITC, page 83-89. IEEE Computer Society, (2002)Diagnosing timing related cell internal defects for FinFET technology., , , , and . VLSI-DAT, page 1-4. IEEE, (2015)On Using Design Partitioning to Reduce Diagnosis Memory Footprint., , , , and . Asian Test Symposium, page 219-225. IEEE Computer Society, (2011)Interconnect open defect diagnosis with minimal physical information., , , , , and . ITC, page 1-10. IEEE Computer Society, (2007)