( en | de | ru )

 

Disambiguation of "Song, Ruiqiang"

Author of the publication

copydeleteadd this publication to your clipboard
Modeling the impact of process and operation variations on the soft error rate of digital circuits.

, , , , and . Sci. China Inf. Sci., 60 (12): 129402 (2017)

Please choose a person to relate this publication to

To differ between persons with the same name, the academic degree and the title of an important publication will be displayed. You can also use the button next to the name to display some publications already assigned to the person.

Song Song

Song Song

Song-Hak Song-Schreff

Peng Song

Song Gao

 

Other publications of authors with the same name

Machine Learning based SET Propagation Prediction for Large Scale Integrated Circuits., , , and . ASICON, page 1-4. IEEE, (2021)Supply Voltage and Temperature Dependence of Single-Event Transient in 28-nm FDSOI MOSFETs., , , , and . Symmetry, 11 (6): 793 (2019)A Single-Event Upset Evaluation Approach Using Ion-Induced Sensitive Area., , , , and . ASICON, page 1-4. IEEE, (2019)Single event transient propagation in dynamic complementary metal oxide semiconductor cascade circuits., , , , , and . IEICE Electron. Express, 12 (23): 20150849 (2015)Characterization of P-hit and N-hit single-event transient using heavy ion microbeam., , , , and . IEICE Electron. Express, 16 (8): 20190141 (2019)Circuit-Level Soft Error Rate Evaluation Approach Considering Single-Event Multiple Transient., , and . ASICON, page 1-4. IEEE, (2019)Comparison of single-event upset generated by heavy ion and pulsed laser., , , , , , , , and . Sci. China Inf. Sci., 60 (7): 072401:1-072401:9 (2017)Flip-flops soft error rate evaluation approach considering internal single-event transient., , , and . Sci. China Inf. Sci., 58 (6): 1-12 (2015)Modeling the impact of process and operation variations on the soft error rate of digital circuits., , , , and . Sci. China Inf. Sci., 60 (12): 129402 (2017)MSIFF: A radiation-hardened flip-flop via interleaving master-slave stage layout topology., , , , and . IEICE Electron. Express, 17 (4): 20190708 (2020)