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Dynamic Faults in Random-Access-Memories: Concept, Fault Models and Tests., , , and . J. Electron. Test., 19 (2): 195-205 (2003)March Tests for Realistic Faults in Two-Port Memories., , , and . MTDT, page 73-78. IEEE Computer Society, (2000)Debating the Future of Burn-In., , , , , and . VTS, page 311-314. IEEE Computer Society, (2002)Test challenges for deep sub-micron technologies., , , and . DAC, page 142-149. ACM, (2000)2001 Technology Roadmap for Semiconductors., , , , , and . Computer, 35 (1): 42-53 (2002)2003 Technology Roadmap for Semiconductors., , , and . Computer, 37 (1): 47-56 (2004)March SL: A Test For All Static Linked Memory Faults., , , and . Asian Test Symposium, page 372-377. IEEE Computer Society, (2003)March SS: A Test for All Static Simple RAM Faults., , and . MTDT, page 95-100. IEEE Computer Society, (2002)ITRS Test Chapter 2001: We'll Tell You What We're Doing, You Tell Us What We Should Be Doing.. VTS, page 155-157. IEEE Computer Society, (2001)Linked faults in random access memories: concept, fault models, test algorithms, and industrial results., , , and . IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 23 (5): 737-757 (2004)