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Disambiguation of "Weckx, Pieter"

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Degradation analysis of high performance 14nm FinFET SRAM.

, , , , , , and . DATE, page 201-206. IEEE, (2018)

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Pieter Ploumen

Pieter Wolter

Pieter Zwieten

Pieter Dingeldey

Pieter Steenhuis

 

Other publications of authors with the same name

On reliability enhancement using adaptive core voltage scaling and variations on nanoscale FPGAs., , , and . LATW, page 1-4. IEEE, (2014)Design of a 150 mV Supply, 2 MIPS, 90nm CMOS, Ultra-Low-Power Microprocessor., , , and . PATMOS, volume 7606 of Lecture Notes in Computer Science, page 175-184. Springer, (2012)Methodology for Application-Dependent Degradation Analysis of Memory Timing., , , , , , and . DATE, page 162-167. IEEE, (2019)Comparison of NBTI aging on adder architectures and ring oscillators in the downscaling technology nodes., , , , , , , , , and 5 other author(s). Microprocess. Microsystems, 39 (8): 1039-1051 (2015)Comphy - A compact-physics framework for unified modeling of BTI., , , , , , , , , and 4 other author(s). Microelectron. Reliab., (2018)Understanding the Impact of Time-Dependent Random Variability on Analog ICs: From Single Transistor Measurements to Circuit Simulations., , , , , and . IEEE Trans. Very Large Scale Integr. Syst., 27 (3): 601-610 (2019)Experimental evidences and simulations of trap generation along a percolation path., , , , , , , , , and . ESSDERC, page 226-229. IEEE, (2015)Learning-Oriented Reliability Improvement of Computing Systems From Transistor to Application Level., , , , , , , , , and 5 other author(s). DATE, page 1-10. IEEE, (2023)Design enablement of CFET devices for sub-2nm CMOS nodes., , , , , , , and . DATE, page 29-33. IEEE, (2022)Block-level Evaluation and Optimization of Backside PDN for High-Performance Computing at the A14 node., , , , , , , , , and 4 other author(s). VLSI Technology and Circuits, page 1-2. IEEE, (2023)