( en | de | ru )

 

Disambiguation of "Kim, Chris H."

Author of the publication

copydeleteadd this publication to your clipboard
A Pathway to Enable Exponential Scaling for the Beyond-CMOS Era: Invited.

, , , , , , , , , , , , , and . DAC, page 16:1-16:6. ACM, (2017)

Please choose a person to relate this publication to

To differ between persons with the same name, the academic degree and the title of an important publication will be displayed. You can also use the button next to the name to display some publications already assigned to the person.

Nam-h Kim

Nam-h Kim

Chris H J F Eigkemans

Ki-h ng Kim

Ch ng-h Kim

 

Other publications of authors with the same name

A logic-compatible embedded flash memory featuring a multi-story high voltage switch and a selective refresh scheme., , and . VLSIC, page 130-131. IEEE, (2012)A data remanence based approach to generate 100% stable keys from an SRAM physical unclonable function., , , , and . ISLPED, page 1-6. IEEE, (2017)Predicting Soft-Response of MUX PUFs via Logistic Regression of Total Delay Difference., , , and . ISCAS, page 1-5. IEEE, (2018)Soft Response Generation and Thresholding Strategies for Linear and Feed-Forward MUX PUFs., , , , and . ISLPED, page 124-129. ACM, (2016)Guest editors' introduction: Nanoscale Memories Pose Unique Challenges., and . IEEE Des. Test Comput., 28 (1): 6-8 (2011)A Voltage Scalable 0.26 V, 64 kb 8T SRAM With Vmin Lowering Techniques and Deep Sleep Mode., , and . IEEE J. Solid State Circuits, 44 (6): 1785-1795 (2009)Silicon Odometer: An On-Chip Reliability Monitor for Measuring Frequency Degradation of Digital Circuits., , and . IEEE J. Solid State Circuits, 43 (4): 874-880 (2008)Reliable PUF-Based Local Authentication With Self-Correction., , , and . IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 36 (2): 201-213 (2017)A Counter based ADC Non-linearity Measurement Circuit and Its Application to Reliability Testing., , , , , and . CICC, page 1-4. IEEE, (2019)SRAM read performance degradation under asymmetric NBTI and PBTI stress: Characterization vehicle and statistical aging data., , and . CICC, page 1-4. IEEE, (2014)