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Design and analysis of piezoelectric cantilevers with enhanced higher eigenmodes for atomic force microscopy., , and . AIM, page 719-724. IEEE, (2017)Lyapunov Estimator for High-Speed Demodulation in Dynamic Mode Atomic Force Microscopy., , , , and . IEEE Trans. Contr. Sys. Techn., 26 (2): 765-772 (2018)On-chip atomic force microscopy: Mechatronic system design and control., , , and . ACC, page 3093. IEEE, (2016)Design of Hybrid Piezoelectric/Piezoresistive Cantilevers for Dynamic-mode Atomic Force Microscopy., and . AIM, page 144-149. IEEE, (2018)Adaptive Scan for Atomic Force Microscopy Based on Online Optimization: Theory and Experiment., , , , and . IEEE Trans. Contr. Sys. Techn., 28 (3): 869-883 (2020)Multi-mode resonant control of a microcantilever for Atomic Force Microscopy., , and . AIM, page 77-82. IEEE, (2013)A Kalman Filter for Amplitude Estimation in High-Speed Dynamic Mode Atomic Force Microscopy., , , and . IEEE Trans. Control. Syst. Technol., 24 (1): 276-284 (2016)Direct Design of Closed-loop Demodulators for Amplitude Modulation Atomic Force Microscopy., , , and . ACC, page 4336-4341. IEEE, (2018)2018 IEEE Transactions on Control Systems Technology Outstanding Paper Award.. IEEE Trans. Contr. Sys. Techn., 27 (2): 463 (2019)Frequency domain analysis of robust demodulators for high-speed atomic force microscopy., , , , and . ACC, page 1562-1567. IEEE, (2017)