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Floating Point Fault Tolerance with Backward Error Assertions.

, , , , and . IEEE Trans. Computers, 44 (2): 302-311 (1995)

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Pseudorandom Testing., , and . IEEE Trans. Computers, 36 (3): 332-343 (1987)Logic Design of Multivalued I2L Logic Circuits.. IEEE Trans. Computers, 28 (8): 546-559 (1979)Analysis of Logic Circuits with Faults Using Input Signal Probabilities., and . IEEE Trans. Computers, 24 (5): 573-578 (1975)An Experimental Study Comparing 74LS181 Test Sets., , and . COMPCON, page 384-387. IEEE Computer Society, (1985)Built-In Verification Test.. ITC, page 183-190. IEEE Computer Society, (1982)An Analysis of the Multiple Fault Detection Capabilities of Single Stuck-at Fault Test Sets., and . ITC, page 52-58. IEEE Computer Society, (1984)Test Teaching.. ITC, page 235. IEEE Computer Society, (1985)Summary of Structural integrity Checking., , and . RTSS, page 107-109. IEEE Computer Society, (1980)Test and Diagnosis Procedure for Digital Networks.. Computer, 4 (1): 17-20 (1971)Open faults in BiCMOS gates., and . IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 14 (5): 567-575 (1995)