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Disambiguation of "Keshavarzi, Ali"

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Multiple-parameter CMOS IC testing with increased sensitivity for I_DDQ.

, , , , , and . ITC, page 1051-1059. IEEE Computer Society, (2000)

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Farhad Keshavarzi

ali

Ali Aassie Ali

Ali Yasen Ali

Ali Al-Ali

 

Other publications of authors with the same name

FerroElectronics for Edge Intelligence., , , , and . IEEE Micro, 40 (6): 33-48 (2020)Towards site-specific management of soil organic carbon: Comparing support vector machine and ordinary kriging approaches based on pedo-geomorphometric factors., , , and . Comput. Electron. Agric., (January 2024)Test Methodologies in the Deep Submicron Era - Analog, Mixed-Signal, and RF., , , and . VLSI Design, page 12-13. IEEE Computer Society, (2005)Parameter variations and impact on circuits and microarchitecture., , , , , and . DAC, page 338-342. ACM, (2003)Adaptive circuit techniques to minimize variation impacts on microprocessor performance and power., , , and . ISCAS (1), page 9-12. IEEE, (2005)Effectiveness of reverse body bias for leakage control in scaled dual Vt CMOS ICs., , , , , , , and . ISLPED, page 207-212. ACM, (2001)2 GHz 2 Mb 2T Gain Cell Memory Macro With 128 GBytes/sec Bandwidth in a 65 nm Logic Process Technology., , , , , , , , , and 1 other author(s). IEEE J. Solid State Circuits, 44 (1): 174-185 (2009)Modeling soil cation exchange capacity using soil parameters: Assessing the heuristic models., , , , , , and . Comput. Electron. Agric., (2017)Leakage and Process Variation Effects in Current Testing on Future CMOS Circuits., , , , , , , and . IEEE Des. Test Comput., 19 (5): 36-43 (2002)A Fast Concurrent Power-Thermal Model for Sub-100nm Digital ICs., , , , and . DATE, page 206-211. IEEE Computer Society, (2005)