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Disambiguation of "Restifo, Marco"

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A DMA and CACHE-based stress schema for burn-in of automotive microcontroller.

, , , , , , and . LATS, page 1-6. IEEE, (2017)

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Johannes Marcour

Hans-Ernst Marcolin

Monika Marcotty

Carlos Javier Marcos Navas

Massimiliano Marcon

 

Other publications of authors with the same name

A DMA and CACHE-based stress schema for burn-in of automotive microcontroller., , , , , , and . LATS, page 1-6. IEEE, (2017)Reliability and Testing of Complex Safety-Critical Automotive SoC.. Polytechnic University of Turin, Italy, (2020)A Hybrid In-Field Self-Test Technique for SoCs., , and . DTIS, page 1-6. IEEE, (2019)Innovative Practices on Automotive Test., , and . VTS, page 1. IEEE, (2019)Scan chain encryption for the test, diagnosis and debug of secure circuits., , , , , and . ETS, page 1-6. IEEE, (2017)Effective Screening of Automotive SoCs by Combining Burn-In and System Level Test., , , , , , , , , and . DDECS, page 1-6. IEEE, (2019)On-line software-based self-test for ECC of embedded RAM memories., , , and . DFT, page 1-6. IEEE Computer Society, (2017)Adaptive Management Techniques for Optimized Burn-in of Safety-Critical SoC., , , , , , and . J. Electron. Test., 34 (1): 43-52 (2018)Applicative System Level Test introduction to Increase Confidence on Screening Quality., , , , , and . DDECS, page 1-6. IEEE, (2020)An Evolutionary Algorithm Approach to Stress Program Generation During Burn-In., , , , , , , , , and 1 other author(s). J. Low Power Electron., 14 (1): 86-98 (2018)