M. Nicolae, {. Gaussier, A. Habrard, and M. Sebban. Joint European Conference on Machine Learning and Knowledge Discovery in Databases, page 594--609. Springer, (2015)
S. Chopra, R. Hadsell, and Y. LeCun. Computer Vision and Pattern Recognition, 2005. CVPR 2005. IEEE Computer Society Conference on, 1, page 539--546. IEEE, (2005)
M. Nicolae, M. Sebban, A. Habrard, E. Gaussier, and M. Amini. chapter Algorithmic Robustness for Semi-Supervised (e,g,t)-Good Metric Learning, page 253--263. Springer International Publishing, Cham, (2015)