H. Meuel, S. Ferenz, F. Kluger, and J. Ostermann. Proc. of the 17th international Conference on Computer Analysis of Images and Patterns, (August 2017)Accepted for publication.
H. Meuel, M. Munderloh, and J. Ostermann. Proceedings of the 12th IEEE International Conference on Advanced Video and Signal based Surveillance (AVSS), (August 2015)accepted for publication.