%0 Conference Paper %1 Stephenson.2004 %A Stephenson, Zoë %A Zhan, Yuan %A Clark, John %A McDermid, John %B SPLiT ’04: Proceedings of the International Workshop on Software Product Line Testing %C Boston and MA %D 2004 %E Geppert, Birgit %E Krueger, Charles %E Li, Jenny %K binding_generation_line_product_testdata_variant %P 13–18 %T Test Data Generation for Product Lines - A Mutation Testing Approach %X Modern product lines typically generate large and complex software products. There is an associated cost increase from the need to test such products, especially for a safety-critical embedded system. We propose a method by which characteristics of the product line can be used as a way of reducing the test data search space and providing effective test data for relevant testing problems. We illustrate this with a solution to the problem of checking that a generated instance is a correct reflection of the required behavior.

@inproceedings{Stephenson.2004, abstract = {Modern product lines typically generate large and complex software products. There is an associated cost increase from the need to test such products, especially for a safety-critical embedded system. We propose a method by which characteristics of the product line can be used as a way of reducing the test data search space and providing effective test data for relevant testing problems. We illustrate this with a solution to the problem of checking that a generated instance is a correct reflection of the required behavior.}, added-at = {2013-10-18T15:42:33.000+0200}, address = {Boston and MA}, author = {Stephenson, Zoë and Zhan, Yuan and Clark, John and McDermid, John}, biburl = {https://www.bibsonomy.org/bibtex/27d309f0979320ab9fc02b8452d7c2d40/hlackner}, booktitle = {SPLiT ’04: Proceedings of the International Workshop on Software Product Line Testing}, editor = {Geppert, Birgit and Krueger, Charles and Li, Jenny}, interhash = {0e491b91579960794fb4c50eade5f29c}, intrahash = {7d309f0979320ab9fc02b8452d7c2d40}, keywords = {binding_generation_line_product_testdata_variant}, pages = {13–18}, timestamp = {2013-10-18T15:42:33.000+0200}, title = {Test Data Generation for Product Lines - A Mutation Testing Approach}, year = 2004 }