Inproceedings,
Compact and complete test set generation for multiple stuck-faults.
A. Agrawal, A. Saldanha, L. Lavagno, and A. Sangiovanni-Vincentelli.ICCAD, page 212-219. IEEE Computer Society / ACM, (1996)
Meta data
- BibTeX key
- conf/iccad/AgrawalSLS96
- entry type
- inproceedings
- booktitle
- ICCAD
- year
- 1996
- pages
- 212-219
- publisher
- IEEE Computer Society / ACM
- crossref
- conf/iccad/1996
- ee
- https://dl.acm.org/citation.cfm?id=244559
- isbn
- 0-8186-7597-7
- url
- http://dblp.uni-trier.de/db/conf/iccad/iccad1996.html#AgrawalSLS96
Tags
Users
Comments and Reviewsshow / hide
Cite this publication
More citation styles
- please select -%0 Conference Paper
%1 conf/iccad/AgrawalSLS96
%A Agrawal, Alok
%A Saldanha, Alexander
%A Lavagno, Luciano
%A Sangiovanni-Vincentelli, Alberto L.
%B ICCAD
%D 1996
%E Rutenbar, Rob A.
%E Otten, Ralph H. J. M.
%I IEEE Computer Society / ACM
%K dblp
%P 212-219
%T Compact and complete test set generation for multiple stuck-faults.
%U http://dblp.uni-trier.de/db/conf/iccad/iccad1996.html#AgrawalSLS96
%@ 0-8186-7597-7
@inproceedings{conf/iccad/AgrawalSLS96,
added-at = {2023-03-24T00:00:00.000+0100},
author = {Agrawal, Alok and Saldanha, Alexander and Lavagno, Luciano and Sangiovanni-Vincentelli, Alberto L.},
biburl = {https://www.bibsonomy.org/bibtex/2d8d3689f95d2d2b9f36d6988ba83b8ec/dblp},
booktitle = {ICCAD},
crossref = {conf/iccad/1996},
editor = {Rutenbar, Rob A. and Otten, Ralph H. J. M.},
ee = {https://dl.acm.org/citation.cfm?id=244559},
interhash = {0f7dcf2dc78ebc903b4f9e6dd63fe26f},
intrahash = {d8d3689f95d2d2b9f36d6988ba83b8ec},
isbn = {0-8186-7597-7},
keywords = {dblp},
pages = {212-219},
publisher = {IEEE Computer Society / ACM},
timestamp = {2024-04-10T20:50:01.000+0200},
title = {Compact and complete test set generation for multiple stuck-faults.},
url = {http://dblp.uni-trier.de/db/conf/iccad/iccad1996.html#AgrawalSLS96},
year = 1996
}