%0 Conference Paper %1 conf/asicon/GaoCNHL21 %A Gao, Shuai %A Cai, Chang %A Ning, Bingxu %A He, Ze %A Liu, Jie %B ASICON %D 2021 %E Ye, Fan %E Tang, Ting-Ao %I IEEE %K dblp %P 1-4 %T Characterization and Classification of Heavy Ion Induced Failures in FPGA-based Logical Circuits. %U http://dblp.uni-trier.de/db/conf/asicon/asicon2021.html#GaoCNHL21 %@ 978-1-6654-3867-4

@inproceedings{conf/asicon/GaoCNHL21, added-at = {2023-06-26T00:00:00.000+0200}, author = {Gao, Shuai and Cai, Chang and Ning, Bingxu and He, Ze and Liu, Jie}, biburl = {https://www.bibsonomy.org/bibtex/2b4a929a2101d2d226328f282024d173c/dblp}, booktitle = {ASICON}, crossref = {conf/asicon/2021}, editor = {Ye, Fan and Tang, Ting-Ao}, ee = {https://doi.org/10.1109/ASICON52560.2021.9620393}, interhash = {0100a12afa5fdf2433494ab8ad285519}, intrahash = {b4a929a2101d2d226328f282024d173c}, isbn = {978-1-6654-3867-4}, keywords = {dblp}, pages = {1-4}, publisher = {IEEE}, timestamp = {2024-04-09T23:07:13.000+0200}, title = {Characterization and Classification of Heavy Ion Induced Failures in FPGA-based Logical Circuits.}, url = {http://dblp.uni-trier.de/db/conf/asicon/asicon2021.html#GaoCNHL21}, year = 2021 }