%0 Conference Paper %1 conf/ats/YotsuyanagiHHT01 %A Yotsuyanagi, Hiroyuki %A Hata, Shinsuke %A Hashizume, Masaki %A Tamesada, Takeomi %B Asian Test Symposium %D 2001 %I IEEE Computer Society %K dblp %P 23- %T Sequential Redundancy Removal Using Test Generation and Multiple Unreachable States. %U http://dblp.uni-trier.de/db/conf/ats/ats2001.html#YotsuyanagiHHT01 %@ 0-7695-1378-6

@inproceedings{conf/ats/YotsuyanagiHHT01, added-at = {2023-03-24T00:00:00.000+0100}, author = {Yotsuyanagi, Hiroyuki and Hata, Shinsuke and Hashizume, Masaki and Tamesada, Takeomi}, biburl = {https://www.bibsonomy.org/bibtex/20d88db4a78349861d41d175643eab719/dblp}, booktitle = {Asian Test Symposium}, crossref = {conf/ats/2001}, ee = {https://doi.ieeecomputersociety.org/10.1109/ATS.2001.990253}, interhash = {01bf2141d96ff725a5c21952ad42c04e}, intrahash = {0d88db4a78349861d41d175643eab719}, isbn = {0-7695-1378-6}, keywords = {dblp}, pages = {23-}, publisher = {IEEE Computer Society}, timestamp = {2024-04-10T06:35:48.000+0200}, title = {Sequential Redundancy Removal Using Test Generation and Multiple Unreachable States.}, url = {http://dblp.uni-trier.de/db/conf/ats/ats2001.html#YotsuyanagiHHT01}, year = 2001 }