%0 Journal Article %1 journals/mr/ChivukulaTSSJ14 %A Chivukula, Venkata %A Teeter, Douglas %A Scott, Preston %A Shah, Bhavin %A Ji, Ming %D 2014 %J Microelectron. Reliab. %K dblp %N 12 %P 2688-2696 %T Implications of thermal instability on HBT power amplifier reliability. %U http://dblp.uni-trier.de/db/journals/mr/mr54.html#ChivukulaTSSJ14 %V 54

@article{journals/mr/ChivukulaTSSJ14, added-at = {2020-02-22T00:00:00.000+0100}, author = {Chivukula, Venkata and Teeter, Douglas and Scott, Preston and Shah, Bhavin and Ji, Ming}, biburl = {https://www.bibsonomy.org/bibtex/21b1a4d273ae18900b6758d608b41e6d0/dblp}, ee = {https://doi.org/10.1016/j.microrel.2014.09.015}, interhash = {026ba130fc53e2fe5f91af6c10ac2a7d}, intrahash = {1b1a4d273ae18900b6758d608b41e6d0}, journal = {Microelectron. Reliab.}, keywords = {dblp}, number = 12, pages = {2688-2696}, timestamp = {2020-02-25T13:29:24.000+0100}, title = {Implications of thermal instability on HBT power amplifier reliability.}, url = {http://dblp.uni-trier.de/db/journals/mr/mr54.html#ChivukulaTSSJ14}, volume = 54, year = 2014 }