%0 Conference Paper %1 conf/isqed/UptonL0TRRNMM23 %A Upton, Luke R. %A Lallement, Guénolé %A Scott, Michael D. %A Taylor, Joyce %A Radway, Robert M. %A Rich, Dennis %A Nelson, Mark %A Mitra, Subhasish %A Murmann, Boris %B ISQED %D 2023 %I IEEE %K dblp %P 1-7 %T Testbench on a Chip: A Yield Test Vehicle for Resistive Memory Devices. %U http://dblp.uni-trier.de/db/conf/isqed/isqed2023.html#UptonL0TRRNMM23 %@ 979-8-3503-3475-3

@inproceedings{conf/isqed/UptonL0TRRNMM23, added-at = {2024-05-07T00:00:00.000+0200}, author = {Upton, Luke R. and Lallement, Guénolé and Scott, Michael D. and Taylor, Joyce and Radway, Robert M. and Rich, Dennis and Nelson, Mark and Mitra, Subhasish and Murmann, Boris}, biburl = {https://www.bibsonomy.org/bibtex/250c320773a57fec08fbf518cf3c1fbd8/dblp}, booktitle = {ISQED}, crossref = {conf/isqed/2023}, ee = {https://doi.org/10.1109/ISQED57927.2023.10129298}, interhash = {04d7caea8da6d67e0e502818a6d62792}, intrahash = {50c320773a57fec08fbf518cf3c1fbd8}, isbn = {979-8-3503-3475-3}, keywords = {dblp}, pages = {1-7}, publisher = {IEEE}, timestamp = {2024-05-13T09:23:48.000+0200}, title = {Testbench on a Chip: A Yield Test Vehicle for Resistive Memory Devices.}, url = {http://dblp.uni-trier.de/db/conf/isqed/isqed2023.html#UptonL0TRRNMM23}, year = 2023 }