%0 Conference Paper %1 conf/ats/HouLHSC16 %A Hou, Po-Fan %A Lin, Yi-Tsung %A Huang, Jiun-Lang %A Shih, Ann %A Conroy, Zoe F. %B ATS %D 2016 %I IEEE Computer Society %K dblp %P 167-172 %T An IR-Drop Aware Test Pattern Generator for Scan-Based At-Speed Testing. %U http://dblp.uni-trier.de/db/conf/ats/ats2016.html#HouLHSC16 %@ 978-1-5090-3809-1

@inproceedings{conf/ats/HouLHSC16, added-at = {2023-03-24T00:00:00.000+0100}, author = {Hou, Po-Fan and Lin, Yi-Tsung and Huang, Jiun-Lang and Shih, Ann and Conroy, Zoe F.}, biburl = {https://www.bibsonomy.org/bibtex/256a5d43c3b8f6cf81c1ef6299030e10c/dblp}, booktitle = {ATS}, crossref = {conf/ats/2016}, ee = {https://doi.ieeecomputersociety.org/10.1109/ATS.2016.23}, interhash = {0545c8457edb9851ef901e9f18c34bfb}, intrahash = {56a5d43c3b8f6cf81c1ef6299030e10c}, isbn = {978-1-5090-3809-1}, keywords = {dblp}, pages = {167-172}, publisher = {IEEE Computer Society}, timestamp = {2024-04-10T06:36:46.000+0200}, title = {An IR-Drop Aware Test Pattern Generator for Scan-Based At-Speed Testing.}, url = {http://dblp.uni-trier.de/db/conf/ats/ats2016.html#HouLHSC16}, year = 2016 }