%0 Conference Paper %1 conf/dac/AgarwalN07 %A Agarwal, Kanak %A Nassif, Sani R. %B DAC %D 2007 %I IEEE %K dblp %P 396-399 %T Characterizing Process Variation in Nanometer CMOS. %U http://dblp.uni-trier.de/db/conf/dac/dac2007.html#AgarwalN07

@inproceedings{conf/dac/AgarwalN07, added-at = {2018-11-06T00:00:00.000+0100}, author = {Agarwal, Kanak and Nassif, Sani R.}, biburl = {https://www.bibsonomy.org/bibtex/2f2bead23d0be165b8702750f5f18a45c/dblp}, booktitle = {DAC}, crossref = {conf/dac/2007}, ee = {https://doi.org/10.1145/1278480.1278582}, interhash = {05dc14a698823e7593434319fd5dd4be}, intrahash = {f2bead23d0be165b8702750f5f18a45c}, keywords = {dblp}, pages = {396-399}, publisher = {IEEE}, timestamp = {2018-11-07T15:12:28.000+0100}, title = {Characterizing Process Variation in Nanometer CMOS.}, url = {http://dblp.uni-trier.de/db/conf/dac/dac2007.html#AgarwalN07}, year = 2007 }